Reliability and Repeatability
Measuring step surface characteristics is a crucial process in a countless number of today’s high tech applications including semiconductor and industrial thin films, microfluidics and solar processing. Achieving better than 4Å repeatability at nanometer level resolution, the Dektak is your solution for applications requiring step height and roughness measurements, stress analysis, and 3D mapping. With over 10,000 units sold, the Dektak has earned its reputation as the standard for step height and stress measurements.
Key Applications and Features:
- Excellent for thin film coatings, microfluidics, and solar cell applications
- Stylus changing in minutes
- Sub-nanometer resolution with 4Å Repeatability
- Calibrated sensor head across all step heights
Take a Closer Look
Check out the Dektak’s design, software, and application features in this quick video…
Since its original debut in 1967, the Dektak has evolved with research demands to keep up with performance requirements. Currently in its 10th generation, the Dektak XT incorporates a single arch design, nanometer level resolution, and up to 40% faster scan speeds.
The XTL builds on the high standards of the XT, offering an enlarged analysis range. With a 350mm x 350mm sample stage, the XTL also incorporates pattern recognition, dual cameras, a load lock, and a high degree of automation, making it well suited for both large sample R&D and production environments.
We’re here to help…
Here at IES we work diligently to understand your application goals, configure the best solution, and ensure you get the results possible. Have questions or looking for advice? Give us a call, or click the link below to send a message to an expert today describing your requirements.